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Norm
ÖVE/ÖNORM EN 62951-1
Issue date: 2016 01 15
Semiconductor devices - Flexible and stretchable semiconductor devices -- Part 1: Bending test method for conductive thin films on flexible substrates (IEC 47/2256/CDV) (english version)
Valid
Publisher:
Austrian Standards International
Format:
Digital | 16 Pages
Language:
English
ICS