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Norm

ÖVE/ÖNORM EN 62373

Issue date: 2007 03 01

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006)

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Valid
Publisher:
Austrian Standards International
Format:
Digital | 14 Pages
Language:
German
ICS
31.080.30
Topics
IT, communication & electronic, Electronic components, Transistors
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ÖVE/ÖNORM EN 62373
2007 03 01
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (I...
Norm
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