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Norm

ÖVE/ÖNORM EN 62276

Issue date: 2013 10 01

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012) (english version)

This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum galliu...
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Withdrawn : 2019 11 01
Publisher:
Austrian Standards International
Format:
Digital | 50 Pages
Language:
English
Currently valid:
OVE EN 62276:2017 10 01
ICS
31.140
Topics
IT, communication & electronic, Electronic components, Piezoelectric devices
This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.
OVE EN 62276
2017 10 01
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measu...
Norm
OVE EN 62276
2017 10 01
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measu...
Norm
ÖVE/ÖNORM EN 62276
2013 10 01
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measu...
Norm
↖
ÖVE/ÖNORM EN 62276
2006 05 01
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measu...
Norm
Historie aufklappen
Norm
OVE EN 62276
Issue date : 2017 10 01
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods ( IEC 62276:2016) (english version)
Norm
OVE EN 62276
Issue date : 2017 10 01
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods ( IEC 62276:2016) (german version)