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Norm

ÖVE/ÖNORM EN 62276

Issue date: 2013 10 01

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012) (german version)

Diese ÖVE/ÖNORM EN gilt für die Herstellung von Einkristall-Wafern aus synthetischen Quarzkristallen, Lithiumniobat-(LN-), Lithiumtantalat-(LT-), Lithiumtetraborat-(LBO-)...
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Withdrawn : 2019 11 01
Publisher:
Austrian Standards International
Format:
Digital | 43 Pages
Language:
German
Currently valid:
OVE EN 62276:2017 10 01
ICS
31.140
Topics
IT, communication & electronic, Electronic components, Piezoelectric devices
Diese ÖVE/ÖNORM EN gilt für die Herstellung von Einkristall-Wafern aus synthetischen Quarzkristallen, Lithiumniobat-(LN-), Lithiumtantalat-(LT-), Lithiumtetraborat-(LBO-)Kristallen und Lanthanum-Gallium-Silikat (LGS), die für die Verwendung als Substrate bei der Herstellung von Oberflächenwellen-(OFW-)Filtern und Resonatoren vorgesehen sind.
OVE EN 62276
2017 10 01
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measu...
Norm
OVE EN 62276
2017 10 01
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measu...
Norm
ÖVE/ÖNORM EN 62276
2013 10 01
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measu...
Norm
↖
ÖVE/ÖNORM EN 62276
2006 05 01
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measu...
Norm
Historie aufklappen
Norm
OVE EN 62276
Issue date : 2017 10 01
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods ( IEC 62276:2016) (english version)
Norm
OVE EN 62276
Issue date : 2017 10 01
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods ( IEC 62276:2016) (german version)