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Norm

ÖVE/ÖNORM EN 62047-8

Issue date: 2012 02 01

Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 62047-8:2011) (english version)

Valid
Publisher:
Austrian Standards International
Format:
Digital | 26 Pages
Language:
English
ICS
31.080.99
Topics
IT, communication & electronic, Electronic components, Other semiconductor devices
ÖVE/ÖNORM EN 62047-8
2012 02 01
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tens...
Norm
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