Please select and order
€64.38
excl. VAT
CONFIGURE NOW
Norm
ÖVE/ÖNORM EN 62047-3
Issue date: 2007 03 01
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile-testing (IEC 62047-3:2006)
NONE
Read more
Valid
Publisher:
Austrian Standards International
Format:
Digital | 9 Pages
Language:
German
ICS
NONE
ÖVE/ÖNORM EN 62047-3
2007 03 01
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for ...
Norm
↖
Norm
ISO 17561:2002
Issue date :
2002 03 14
Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for elastic moduli of monolithic ceramics at room temperature by sonic resonance
Norm
ISO 17561:2016
Issue date :
2016 06 20
Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for elastic moduli of monolithic ceramics at room temperature by sonic resonance