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Norm
ÖVE/ÖNORM EN 62047-27
Issue date: 2015 12 15
Semiconductor devices - Micro-electromechanical devices -- Part 27: Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT) (IEC 47F/230/CDV) (english version)
Valid
Publisher:
Austrian Standards International
Format:
Digital | 18 Pages
Language:
English
ICS