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Norm

ÖVE/ÖNORM EN 62047-22

Issue date: 2015 06 01

Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (IEC 62047-22:2014) (english version)

Valid
Publisher:
Austrian Standards International
Format:
Digital | 20 Pages
Language:
English
ICS
01.080.99 31.080.01 31.220.01
Topics show all
IT, communication & electronic, Electromechanical components for electronic and telecommunications equipment, Electromechanical components in general IT, communication & electronic, Electronic components, Semiconductor devices in general Electric & lighting engineering, Electromechanical components for electronic and telecommunications equipment, Electromechanical components in general Mechanical engineering foundations & materials, Technical drawing and graphical symbols, Other graphical symbols Services & management, Technical drawing and graphical symbols, Other graphical symbols
ÖVE/ÖNORM EN 62047-22
2015 06 01
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test me...
Norm
↖
Norm
ÖNORM EN ISO 527-3
Issue date : 2003 02 01
Plastics - Determination of tensile properties - Part 3: Test conditions for films and sheets (ISO 527-3:1995 + Corr.1:1998 + Corr.2:2001)
Norm
ISO 527-3:1995
Issue date : 1995 07 27
Plastics — Determination of tensile properties — Part 3: Test conditions for films and sheets