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Norm
ÖVE/ÖNORM EN 62047-2
Issue date: 2007 03 01
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006)
NONE
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Valid
Publisher:
Austrian Standards International
Format:
Digital | 14 Pages
Language:
German
ICS
NONE
ÖVE/ÖNORM EN 62047-2
2007 03 01
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin fil...
Norm
↖
Norm
ISO 6892:1998
Issue date :
1998 03 05
Metallic materials — Tensile testing at ambient temperature
Draft
ISO/DIS 6892
Issue date :
2007 02 08
Metallic materials — Tensile testing — Method of testing at ambient temperature
Norm
ISO 6892:1998
Issue date :
1998 03 05
Metallic materials — Tensile testing at ambient temperature