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Norm
ÖVE/ÖNORM EN 60749-8
Issue date: 2004 01 01
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing (IEC 60749-8:2002 + Corr.1:2003 + Corr.2:2003)
NONE
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Valid
Publisher:
Austrian Standards International
Format:
Digital | 16 Pages
Language:
German
ICS
NONE