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Norm

ÖVE/ÖNORM EN 60749-33

Issue date: 2004 11 01

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave (IEC 60749-33:2004)

NONE
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Valid
Publisher:
Austrian Standards International
Format:
Digital | 10 Pages
Language:
German
ICS
31.080.01
Topics
IT, communication & electronic, Electronic components, Semiconductor devices in general
NONE
ÖVE/ÖNORM EN 60749-33
2004 11 01
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resista...
Norm
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