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Norm
ÖVE/ÖNORM EN 60749-28
Issue date: 2013 04 15
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM) (IEC 47/2155/CDV)
Valid
Publisher:
Austrian Standards International
Format:
Digital | 24 Pages
Language:
English
ICS