NORM

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ÖVE/ÖNORM EN 60749-28

Issue date: 2013 04 15

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM) (IEC 47/2155/CDV)

General information on ÖVE/ÖNORM EN 60749-28

Format
Digital | 24 Pages
Language
English
Publisher
Austrian Standards International

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ÖVE/ÖNORM EN 60749-28 - Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM) (IEC 47/2155/CDV)

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