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Norm
ÖVE/ÖNORM EN 60749-28
Issue date: 2004 05 01
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) (IEC 47/1751/CDV)
Valid
Publisher:
Austrian Standards International
Format:
Digital | 20 Pages
Language:
English
ICS