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Norm

ÖVE/ÖNORM EN 60749-24

Issue date: 2004 11 01

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 60749-24:2004)

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Valid
Publisher:
Austrian Standards International
Format:
Digital | 11 Pages
Language:
German
ICS
31.080.01
Topics
IT, communication & electronic, Electronic components, Semiconductor devices in general
NONE
ÖVE/ÖNORM EN 60749-24
2004 11 01
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resista...
Norm
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