Please select and order
€64.40
excl. VAT
CONFIGURE NOW
Norm

ÖVE/ÖNORM EN 60749-23

Issue date: 2011 09 01

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004 + A1:2011) (english version)

Valid
Publisher:
Austrian Standards International
Format:
Digital | 20 Pages
Language:
English
ICS
31.080.01
Topics
IT, communication & electronic, Electronic components, Semiconductor devices in general
ÖVE/ÖNORM EN 60749-23
2011 09 01
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating l...
Norm
↖
ÖVE/ÖNORM EN 60749-23
2004 12 01
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating l...
Norm