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Norm

ÖVE/ÖNORM EN 60749-19

Issue date: 2011 03 01

Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength (IEC 60749-19:2003 + A1:2010) (english version)

Valid
Publisher:
Austrian Standards International
Format:
Digital | 16 Pages
Language:
English
ICS
31.080.01
Topics
IT, communication & electronic, Electronic components, Semiconductor devices in general
ÖVE/ÖNORM EN 60749-19
2011 03 01
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength (IEC 6074...
Norm
↖
ÖVE/ÖNORM EN 60749-19
2003 11 01
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength (IEC 6074...
Norm