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Norm

ÖVE/ÖNORM EN 60749-14

Issue date: 2004 08 01

Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) (IEC 60749-14:2003)

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Valid
Publisher:
Austrian Standards International
Format:
Digital | 19 Pages
Language:
German
ICS
31.080.01
Topics
IT, communication & electronic, Electronic components, Semiconductor devices in general
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ÖVE/ÖNORM EN 60749-14
2004 08 01
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (...
Norm
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