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Norm

ÖVE/ÖNORM EN 60444-8

Issue date: 2004 04 01

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003)

NONE
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Withdrawn : 2020 01 01
Publisher:
Austrian Standards International
Format:
Digital | 12 Pages
Language:
German
Currently valid:
OVE EN 60444-8:2017 12 01
ICS
31.140
Topics
IT, communication & electronic, Electronic components, Piezoelectric devices
NONE
OVE EN 60444-8
2017 12 01
Measurement of quartz crystal unit parameters -- Part 8: Test fixture for surface mounted quartz cr...
Norm
OVE EN 60444-8
2017 12 01
Measurement of quartz crystal unit parameters -- Part 8: Test fixture for surface mounted quartz cr...
Norm
ÖVE/ÖNORM EN 60444-8
2004 04 01
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crys...
Norm
↖
Norm
OVE EN 60444-8
Issue date : 2017 12 01
Measurement of quartz crystal unit parameters -- Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016) (english version)
Norm
OVE EN 60444-8
Issue date : 2017 12 01
Measurement of quartz crystal unit parameters -- Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016) (german version)