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Norm

OVE EN IEC 62047-35

Issue date: 2019 02 01

Semiconductor devices - Micro-electromechanical devices -- Part 35: Test method of electrical characteristics under bending deformation for flexible and foldable electro-mechanical devices (IEC 47F/320/CDV) (english version)

Valid
Publisher:
Österreichischer Verband für Elektrotechnik
Format:
Digital | 22 Pages
Language:
English
ICS
31.220.01 31.080.01
Topics
IT, communication & electronic, Electromechanical components for electronic and telecommunications equipment, Electromechanical components in general IT, communication & electronic, Electronic components, Semiconductor devices in general Electric & lighting engineering, Electromechanical components for electronic and telecommunications equipment, Electromechanical components in general