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Norm

ÖNORM EN ISO 18452

Issue date: 2016 11 01

Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005)

This International Standard specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. Th...
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Valid
Publisher:
Austrian Standards International
Format:
Digital | 15 Pages
Language:
German | English | Download GER/ENG
Optionally co-design standards:
This International Standard specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
ÖNORM EN ISO 18452
2016 11 01
Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceram...
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ÖNORM EN ISO 18452
2016 08 15
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ÖNORM EN 1071-1
2003 06 01
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ÖNORM ENV 1071-1
1993 11 01
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Vornorm
Historie aufklappen
Norm
ISO 3274:1996
Issue date : 1996 12 05
Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments
Norm
ISO 18452:2005
Issue date : 2005 11 16
Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer