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Technische Regel
ISO/TS 10867:2010
Issue date: 2010 09 15
Nanotechnologies — Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy
ISO/TS 10867:2010 provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.
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Withdrawn
: 2019 12 04
Publisher:
International Organization for Standardization
Format:
Digital | 14 Pages
Language:
English
Currently valid:
ICS
ISO/TS 10867:2010 provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.
ISO/TS 10867:2010 provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities.
The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.
ISO/TS 10867:2019
2019 12 04
Nanotechnologies — Characterization of single-wall carbon nanotubes using near infrared photolumines...
Technische Regel
ISO/TS 10867:2010
2010 09 15
Nanotechnologies — Characterization of single-wall carbon nanotubes using near infrared photolumines...
Technische Regel
↖
Technische Regel
ISO/TS 10867:2019
Issue date :
2019 12 04
Nanotechnologies — Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy