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Norm

IEC 60333:1993 Ed. 3.0

Issue date: 1993 07 14

Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures

Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described ...
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Withdrawn : 2010 07 15
Publisher:
International Electrotechnical Commission
Format:
Digital | 76 Pages
Language:
English
Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semicond
IEC 60333:1993 Ed. 3.0
1993 07 14
Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures
Norm
IEC 60333:1983 Ed. 2.0
1983 01 01
Test procedures for semiconductor charged-particle detectors
Norm
IEC 60333:1970 Ed. 1.0
1970 01 01
Test procedures for semiconductor detectors for ionizing radiation
Norm