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Norm

ÖVE/ÖNORM EN 60749-30

Issue date: 2005 07 01

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005)

NONE
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Withdrawn : 2014 07 01
Publisher:
Austrian Standards International
Format:
Digital | 15 Pages
Language:
German
Currently valid:
OVE EN IEC 60749-30:2023 03 01
ICS
31.080.01
Topics
IT, communication & electronic, Electronic components, Semiconductor devices in general
NONE
OVE EN IEC 60749-30
2023 03 01
Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-her...
Norm
OVE EN IEC 60749-30
2023 03 01
Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-her...
Norm
ÖVE/ÖNORM EN 60749-30
2012 02 01
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-herme...
Norm
ÖVE/ÖNORM EN 60749-30
2012 02 01
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-herme...
Norm
ÖVE/ÖNORM EN 60749-30
2005 07 01
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-herme...
Norm
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Norm
ÖVE/ÖNORM EN 60749-30
Issue date : 2012 02 01
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005 + A1:2011) (german version)
Norm
ÖVE/ÖNORM EN 60749-30
Issue date : 2012 02 01
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005 + A1:2011) (english version)