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Norm

ÖNORM EN ISO 3274

Issue date: 1998 03 01

Geometrical product specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments (ISO 3274:1996)

This International Standard defines profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness, enabling existing Int...
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This International Standard defines profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness, enabling existing International Standards to be applied to practical profile evaluation. It specifies the properties of the instrument which influence profile evaluation and it provides the basics of the specification of contact (stylus) instruments (profile meter and profile recorder). NOTE 1: A data sheet dealing with characteristics of contact (stylus) instruments to be completed by the instrument makers is under preparation and will be introduced in a future standard on calibration procedures. NOTE 2:The relationships between the waviness cut-off If, tip radius and waviness cut-off ratio are under consideration and will be added to this International Standard as an amendment.
ÖNORM EN ISO 3274
1998 03 01
Geometrical product specifications (GPS) - Surface texture: Profile method - Nominal characteristics...
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Geometrical Product Specifications (GPS) — Surface texture: Profile method; Surfaces having stratified functional properties — Part 2: Height characterization using the linear material ratio curve
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ISO 13565-3:1998
Issue date : 1998 12 03
Geometrical Product Specifications (GPS) — Surface texture: Profile method; Surfaces having stratified functional properties — Part 3: Height characterization using the material probability curve
Norm
ISO 3274:1996
Issue date : 1996 12 05
Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments