STANDARD

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ÖVE/ÖNORM EN 62374-1

Issue date: 2011 08 01

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (IEC 62374-1:2010)

General information on ÖVE/ÖNORM EN 62374-1

Format
Digital | 18 Pages
Language
German | English
Publisher
Austrian Standards International

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ÖVE/ÖNORM EN 62374-1 - Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (IEC 62374-1:2010)

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