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Norm
ISO 18452:2005
Ausgabedatum: 2005 11 16
Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is s...
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Herausgeber:
International Organization for Standardization
Format:
Digital | 9 Seiten
Sprache:
Englisch
ICS
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
ISO 18452:2005
2005 11 16
Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceram...
Norm
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