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Norm
ISO 16526-1:2011
Ausgabedatum: 2011 12 15
Non-destructive testing — Measurement and evaluation of the X-ray tube voltage — Part 1: Voltage divider method
ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of ...
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Herausgeber:
International Organization for Standardization
Format:
Digital | 2 Seiten
Sprache:
Englisch
ICS
ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system.
This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.
ISO 16526-1:2011
2011 12 15
Non-destructive testing — Measurement and evaluation of the X-ray tube voltage — Part 1: Voltage div...
Norm
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