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Norm

ISO 14594:2014

Ausgabedatum: 2014 10 21

Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy

ISO 14594:2014 gives the general guidelines for the determination of experimental parameters relating to the primary beam, the wavelength spectrometer, and the sample tha...
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Herausgeber:
International Organization for Standardization
Format:
Digital | 18 Seiten
Sprache:
Englisch

ISO 14594:2014 gives the general guidelines for the determination of experimental parameters relating to the primary beam, the wavelength spectrometer, and the sample that need to be taken into account when carrying out electron probe microanalysis. It also defines procedures for the determination of beam current, current density, dead time, wavelength resolution, background, analysis area, analysis depth, and analysis volume.

It is intended for the analysis of a well-polished sample using normal beam incidence, and the parameters obtained can only be indicative for other experimental conditions.

It is not designed to be used for energy dispersive X-ray spectroscopy.

ISO 14594:2014
2014 10 21
Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental...
Norm
ISO 14594:2003/Cor 1:2009
2009 03 09
Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental...
Norm
ISO 14594:2003
2003 07 29
Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental...
Norm