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Norm
ISO 13084:2011
Ausgabedatum: 2011 05 05
Surface chemical analysis — Secondary-ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
ISO 13084:2011 specifies a method to optimize the mass calibration accuracy in time-of-flight SIMS instruments used for general analytical purposes. It is only applicable...
Weiterlesen
ZURÜCKGEZOGEN
: 2018 11 15
Herausgeber:
International Organization for Standardization
Format:
Digital | 10 Seiten
Sprache:
Englisch
Aktuell Gültig:
ICS
ISO 13084:2011 specifies a method to optimize the mass calibration accuracy in time-of-flight SIMS instruments used for general analytical purposes. It is only applicable to time-of-flight instruments but is not restricted to any particular instrument design. Guidance is provided for some of the instrumental parameters that can be optimized using this procedure and the types of generic peaks suitable to calibrate the mass scale for optimum mass accuracy.
ISO 13084:2018
2018 11 15
Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a ti...
Norm
ISO 13084:2011
2011 05 05
Surface chemical analysis — Secondary-ion mass spectrometry — Calibration of the mass scale for a ti...
Norm
↖
Norm
ISO 13084:2018
Ausgabedatum :
2018 11 15
Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer