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Norm

IEC 60060-3:1976 Ed. 1.0

Ausgabedatum: 1976 01 01

High-voltage test techniques - Part 3: Measuring devices

Applies to devices and complete systems, other than sphere-gaps, used for the measurement of voltages and currents during dielectric tests with direct voltage, alternatin...
Weiterlesen
ZURÜCKGEZOGEN : 1994 11 23
Herausgeber:
International Electrotechnical Commission
Format:
Digital | 21 Seiten
Sprache:
Englisch
Aktuell Gültig:
IEC 60060-2:2010 Ed. 3.0:2010 11 29
ICS
17.220.20 19.080
Fachgebiete
Electric & lighting engineering, Electricity. Magnetism., Measurement of electrical and magnetic quantities Mechanical engineering foundations & materials, Testing, Electrical and electronic testing
Applies to devices and complete systems, other than sphere-gaps, used for the measurement of voltages and currents during dielectric tests with direct voltage, alternating voltage, lightning and switching impulse voltages and for tests with high-impulse currents. Voltage measurements with sphere-gaps are dealt with in IEC 52. Gives guidance concerning the quantities to be measured, accuracies required and requirements of measuring systems.
IEC 60060-2:2010 Ed. 3.0
2010 11 29
High-voltage test techniques - Part 2: Measuring systems
Norm
IEC 60060-3:2006 Ed. 1.0
2006 02 07
High-voltage test techniques - Part 3: Definitions and requirements for on-site testing
Norm
IEC 60060-2:1994/AMD1:1996 Ed. 2.0
1996 03 13
Amendment 1 - High voltage test techniques - Part 2: Measuring systems
Norm
IEC 60060-2:1994 Ed. 2.0
1994 11 23
High voltage test techniques - Part 2: Measuring systems
Norm
IEC 60060-3:1976 Ed. 1.0
1976 01 01
High-voltage test techniques - Part 3: Measuring devices
Norm
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Historie aufklappen
Norm
IEC 60060-2:1994 Ed. 2.0
Ausgabedatum : 1994 11 23
High voltage test techniques - Part 2: Measuring systems
Norm
IEC 60060-3:2006 Ed. 1.0
Ausgabedatum : 2006 02 07
High-voltage test techniques - Part 3: Definitions and requirements for on-site testing