NORM

Current

OVE EN IEC 60749-30

Issue date: 2023 03 01

Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing ((IEC 60749-30:2020) EN IEC 60749-30:2020)

General information on OVE EN IEC 60749-30

Format
Paper | 18 Pages
Language
German | English
Publisher
Österreichischer Verband für Elektrotechnik

Timeline

An overview of the development of OVE EN IEC 60749-30 from 2005 til today.

  • OVE EN IEC 60749-30
    Norm
  • ÖVE/ÖNORM EN 60749-30
    Norm
  • ÖVE/ÖNORM EN 60749-30
    Norm

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OVE EN IEC 60749-30 - Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing ((IEC 60749-30:2020) EN IEC 60749-30:2020)

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