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ÖVE/ÖNORM EN 62047-6

Erscheinungsdatum: 2010 08 01

Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)

Allgemeine Information zur ÖVE/ÖNORM EN 62047-6

Format
Digital | 17 Seiten
Sprache
German | English
Herausgeber
Austrian Standards International

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ÖVE/ÖNORM EN 62047-6 - Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)

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